We present a non-operational approach to specifying and analyzing shared memory consistency models. The method uses higher order logic to capture a complete set of ordering constra...
Yue Yang, Ganesh Gopalakrishnan, Gary Lindstrom, K...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
The generation of robot controllers for a task requiring a sequence of elementary behaviors is still a challenge. If these behaviors are known, intermediate steps can be given to ...
Many testing and analysis techniques use finite state models to validate and verify the quality of software systems. Since the specification of such models is complex and timecons...
We present an AC1 (logDCFL) algorithm for checking LTL formulas over finite paths, thus establishing that the problem can be efficiently parallelized. Our construction provides a f...