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DAC
1997
ACM
14 years 2 months ago
Hardware/Software Co-Simulation in a VHDL-Based Test Bench Approach
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...
Matthias Bauer, Wolfgang Ecker
FMCO
2006
Springer
128views Formal Methods» more  FMCO 2006»
14 years 1 months ago
Model-Based Test Selection for Infinite-State Reactive Systems
This paper addresses the problem of off-line selection of test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of re...
Bertrand Jeannet, Thierry Jéron, Vlad Rusu
PTS
1998
131views Hardware» more  PTS 1998»
13 years 11 months ago
Factorized Test Generation for Multi-Input/Output Transition Systems
In this paper we present factorized test generation techniques that can be used to generate test cases from a specification that is modelled as a labelled transition system. The t...
Ed Brinksma, Lex Heerink, Jan Tretmans
ECLIPSE
2007
ACM
14 years 1 months ago
UnitPlus: assisting developer testing in Eclipse
In the software development life cycle, unit testing is an important phase that helps in early detection of bugs. A unit test case consists of two parts: a test input, which is of...
Yoonki Song, Suresh Thummalapenta, Tao Xie
ITC
1996
IEEE
98views Hardware» more  ITC 1996»
14 years 2 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...