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» Efficient Testing of Forecasts
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EH
2000
IEEE
123views Hardware» more  EH 2000»
14 years 2 months ago
The Test Vector Problem and Limitations to Evolving Digital Circuits
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...
Kosuke Imamura, James A. Foster, Axel W. Krings
FATES
2006
Springer
14 years 1 months ago
Decompositional Algorithms for Safety Verification and Testing of Aspect-Oriented Systems
To efficiently solve safety verification and testing problems for an aspect-oriented system, we use multitape automata to model aspects and propose algorithms for the aspect-orient...
Cheng Li, Zhe Dang
APPROX
2010
Springer
135views Algorithms» more  APPROX 2010»
13 years 10 months ago
Monotonicity Testing and Shortest-Path Routing on the Cube
We study the problem of monotonicity testing over the hypercube. As previously observed in several works, a positive answer to a natural question about routing properties of the hy...
Jop Briët, Sourav Chakraborty, David Garc&iac...
DAC
2000
ACM
14 years 11 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
MTV
2005
IEEE
101views Hardware» more  MTV 2005»
14 years 3 months ago
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
Paolo Bernardi, Michelangelo Grosso, Maurizio Reba...