This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Background: We consider effects of dependence among variables of high-dimensional data in multiple hypothesis testing problems, in particular the False Discovery Rate (FDR) contro...
This paper presents results from a comparative evaluation of five combination strategies. Combination strategies are test case selection methods that combine "interesting&quo...
The complexity of testing properties of monotone and unimodal distributions, when given access only to samples of the distribution, is investigated. Two kinds of sublineartime alg...