4192 search results - page 104 / 839 » Efficient testing of groups |
119
click to vote
IFIP
2001
Springer
15 years 7 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
122
Voted
HPDC
1999
IEEE
15 years 6 months ago
1999
IEEE
This paper reports on the architecture and design of Starfish, an environment for executing dynamic (and static) MPI-2 programs on a cluster of workstations. Starfish is unique in ...
216
click to vote
ICDE
2007
IEEE
16 years 4 months ago
2007
IEEE
Poor quality data is prevalent in databases due to a variety of reasons, including transcription errors, lack of standards for recording database fields, etc. To be able to query ...
139
click to vote
ET
1998
15 years 2 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
115
Voted
ET
2006
15 years 2 months ago
2006
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...