4192 search results - page 104 / 839 » Efficient testing of groups |
IFIP
2001
Springer
14 years 3 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
HPDC
1999
IEEE
14 years 3 months ago
1999
IEEE
This paper reports on the architecture and design of Starfish, an environment for executing dynamic (and static) MPI-2 programs on a cluster of workstations. Starfish is unique in ...
ICDE
2007
IEEE
15 years 3 days ago
2007
IEEE
Poor quality data is prevalent in databases due to a variety of reasons, including transcription errors, lack of standards for recording database fields, etc. To be able to query ...
ET
1998
13 years 10 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
ET
2006
13 years 10 months ago
2006
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...