4192 search results - page 121 / 839 » Efficient testing of groups |
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
ICALP
2009
Springer
14 years 11 months ago
2009
Springer
We present a range of new results for testing properties of Boolean functions that are defined in terms of the Fourier spectrum. Broadly speaking, our results show that the propert...
ETS
2007
IEEE
14 years 5 months ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
ICIAR
2005
Springer
14 years 4 months ago
2005
Springer
The purpose of this paper is to allow for high level shape representation and matching in multi-object images by detecting and extracting the envelope of object groupings in the im...
CAV
2006
Springer
14 years 2 months ago
2006
Springer
CUTE, a Concolic Unit Testing Engine for C and Java, is a tool to systematically and automatically test sequential C programs (including pointers) and concurrent Java programs. CUT...