4192 search results - page 64 / 839 » Efficient testing of groups |
DFT
2006
IEEE
14 years 4 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
ANTSW
2006
Springer
14 years 2 months ago
2006
Springer
In this paper we look at how the structure of the social network and the nature of the social interactions can affect the behaviour of particle swarms. To this end, we create and ...
CORR
2010
Springer
13 years 10 months ago
2010
Springer
The group Lasso is an extension of the Lasso for feature selection on (predefined) non-overlapping groups of features. The non-overlapping group structure limits its applicability...
TCAD
2008
13 years 10 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
GROUP
2007
ACM
14 years 2 months ago
2007
ACM
Being aware of others' activities has played a vital role in the success of online collaboration. This resulted in the emergence of many groupware systems that provide users ...