Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
Processor cores embedded in systems-on-a-chip (SoCs) are often deployed in critical computations, and when affected by faults they may produce dramatic effects. When hardware harde...
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Regression testing is a widely-used method for checking whether modifications to software systems have adversely affected the overall functionality. This is potentially an expens...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...