67 search results - page 9 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
JNCA
2007
13 years 7 months ago
2007
Powerful microcontrollers are used as parts of most home and office appliances of today. Integrating web servers to these intelligent devices will aid in controlling them over th...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
— There is a growing interest in developing low cost, low power, highly integrated biosensor systems to characterize individual cells for applications such as cell analysis, drug...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
INTEGRATION
1998
13 years 7 months ago
1998
An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-provide...
FLAIRS
2004
13 years 9 months ago
2004
Most decision tree induction methods used for extracting knowledge in classification problems are unable to deal with uncertainties embedded within the data, associated with human...