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EMNETS
2007
13 years 11 months ago
Increasing the reliability of wireless sensor networks with a distributed testing framework
Designing Wireless Sensor Networks (WSNs) has proven to be a slow, tedious and error-prone process due to the inherent intricacies of designing a distributed, wireless, and embedd...
Matthias Woehrle, Christian Plessl, Jan Beutel, Lo...
DFT
2002
IEEE
128views VLSI» more  DFT 2002»
14 years 8 days ago
Matrix-Based Test Vector Decompression Using an Embedded Processor
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
Kedarnath J. Balakrishnan, Nur A. Touba
SERA
2007
Springer
14 years 1 months ago
A Formal Approach to Test the Robustness of Embedded Systems using Behaviour Analysis
Robustness is an important feature required for embedded systems. This paper presents a methodology to test robustness of such systems. We investigate system behaviour aspects. We...
Antoine Rollet, Fares Saad-Khorchef
JAVACARD
2000
13 years 11 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
ISCAS
2008
IEEE
133views Hardware» more  ISCAS 2008»
14 years 1 months ago
A hybrid self-testing methodology of processor cores
—Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new ho...
Tai-Hua Lu, Chung-Ho Chen, Kuen-Jong Lee