3 search results - page 1 / 1 » Emulation-Based Analysis of Soft Errors in Deep Sub-micron C... |
VTS
2000
IEEE
13 years 11 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
FPL
2003
Springer
14 years 20 days ago
2003
Springer
ISVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...