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MVA
2007
146views Computer Vision» more  MVA 2007»
13 years 9 months ago
A SVM Based Method to Detect Color Shift Defects in IC Packages
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari
CSDA
2007
142views more  CSDA 2007»
13 years 8 months ago
DIVCLUS-T: A monothetic divisive hierarchical clustering method
DIVCLUS-T is a divisive hierarchical clustering algorithm based on a monothetic bipartitional approach allowing the dendrogram of the hierarchy to be read as a decision tree. It i...
Marie Chavent, Yves Lechevallier, Olivier Briant
ICPR
2008
IEEE
14 years 9 months ago
Learning weighted distances for relevance feedback in image retrieval
We present a new method for relevance feedback in image retrieval and a scheme to learn weighted distances which can be used in combination with different relevance feedback metho...
Enrique Vidal, Hermann Ney, Roberto Paredes, Thoma...
BMCBI
2004
176views more  BMCBI 2004»
13 years 8 months ago
Boosting accuracy of automated classification of fluorescence microscope images for location proteomics
Background: Detailed knowledge of the subcellular location of each expressed protein is critical to a full understanding of its function. Fluorescence microscopy, in combination w...
Kai Huang, Robert F. Murphy
ECML
2006
Springer
13 years 12 months ago
Evaluating Feature Selection for SVMs in High Dimensions
We perform a systematic evaluation of feature selection (FS) methods for support vector machines (SVMs) using simulated high-dimensional data (up to 5000 dimensions). Several findi...
Roland Nilsson, José M. Peña, Johan ...