72 search results - page 10 / 15 » Estimation and optimization of reliability of noisy digital ... |
ASYNC
1998
IEEE
13 years 12 months ago
1998
IEEE
Analogue to digital (A-D) converters with a xed conversion time are subject to errors due to metastability. These errors will occur in all converter designs with a bounded time fo...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
CASES
2006
ACM
14 years 1 months ago
2006
ACM
Dynamic voltage scaling and sleep state control have been shown to be extremely effective in reducing energy consumption in CMOS circuits. Though plenty of research papers have st...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
PIMRC
2008
IEEE
14 years 2 months ago
2008
IEEE
— Noisy radio frequency (RF) circuits tend to degrade the system performance, especially in high frequency communication systems. The performance analysis of such systems is norm...