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    ICSE
    2005
    IEEE-ACM
    162views Software Engineering» more  ICSE 2005»
    Use of relative code churn measures to predict system defect density
    14 years 7 months ago
    Use of relative code churn measures to predict system defect density
    Download  research.microsoft.com
    Software systems evolve over time due to changes in requirements, optimization of code, fixes for security and reliability bugs etc. Code churn, which measures the changes made to...
    Nachiappan Nagappan, Thomas Ball
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    BMCBI
    2010
    105views more  BMCBI 2010»
    Effects of scanning sensitivity and multiple scan algorithms on microarray data quality
    13 years 7 months ago
    Effects of scanning sensitivity and multiple scan algorithms on microarray data quality
    Download  www.biomedcentral.com
    Background: Maximizing the utility of DNA microarray data requires optimization of data acquisition through selection of an appropriate scanner setting. To increase the amount of ...
    Andrew Williams, Errol M. Thomson
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    GLVLSI
    2007
    IEEE
    194views VLSI» more  GLVLSI 2007»
    Probabilistic maximum error modeling for unreliable logic circuits
    13 years 11 months ago
    Probabilistic maximum error modeling for unreliable logic circuits
    Download  www.eng.usf.edu
    Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
    Karthikeyan Lingasubramanian, Sanjukta Bhanja
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    RTS
    2006
    129views more  RTS 2006»
    Modeling out-of-order processors for WCET analysis
    13 years 7 months ago
    Modeling out-of-order processors for WCET analysis
    Download  www.comp.nus.edu.sg
    Estimating the Worst Case Execution Time (WCET) of a program on a given processor is important for the schedulability analysis of real-time systems. WCET analysis techniques typic...
    Xianfeng Li, Abhik Roychoudhury, Tulika Mitra
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    SDM
    2009
    SIAM
    394views Data Mining» more  SDM 2009»
    Multi-Modal Hierarchical Dirichlet Process Model for Predicting Image Annotation and Image-Object Label Correspondence.
    14 years 4 months ago
    Multi-Modal Hierarchical Dirichlet Process Model for Predicting Image Annotation and Image-Object Label Correspondence.
    Download  www.cs.iastate.edu
    Many real-world applications call for learning predictive relationships from multi-modal data. In particular, in multi-media and web applications, given a dataset of images and th...
    Oksana Yakhnenko, Vasant Honavar
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