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IOLTS
2002
IEEE
99views Hardware» more  IOLTS 2002»
14 years 15 days ago
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
Davide Appello, Alessandra Fudoli, Vincenzo Tancor...
IWC
2006
64views more  IWC 2006»
13 years 7 months ago
Levels of automation and user participation in usability testing
This paper identifies a number of factors involved in current practices of usability testing and presents profiles for three prototype methods: think-aloud, subjective ratings, an...
Kent L. Norman, Emanuele Panizzi
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
VR
2007
IEEE
14 years 1 months ago
Designing and Evaluating a Haptic System for Biomolecular Education
In this paper we present an in situ evaluation of a haptic system, with a representative test population, we aim to determine what, if any, benefit haptics can have in a biomolec...
Petter Bivall Persson, Matthew D. Cooper, Lena A. ...
ICSE
1998
IEEE-ACM
13 years 11 months ago
An Approach to Large-Scale Collection of Application Usage Data Over the Internet
Empirical evaluation of software systems in actual usage situations is critical in software engineering. Prototyping, beta testing, and usability testing are widely used to refine...
David M. Hilbert, David F. Redmiles