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APN
2001
Springer
15 years 7 months ago
Optimising Enabling Tests and Unfoldings of Algebraic System Nets
Reachability analysis and simulation tools for high-level nets spend a significant amount of the computing time in performing enabling tests, determining the assignments under whi...
Marko Mäkelä
LCPC
1998
Springer
15 years 6 months ago
The I+ Test
: In this paper, theoretical aspects to demonstrate the accuracy of the Interval Test (the I test and the direction vector I test) to be applied for resolving the problem stated ab...
Weng-Long Chang, Chih-Ping Chu
INTEGRATION
2006
102views more  INTEGRATION 2006»
15 years 2 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
125
Voted
ET
2000
145views more  ET 2000»
15 years 2 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
ICST
2010
IEEE
15 years 1 months ago
Generating Transition Probabilities for Automatic Model-Based Test Generation
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Abderrahmane Feliachi, Hélène Le Gue...