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» Failure Mechanisms in MEMS
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WWW
2005
ACM
14 years 8 months ago
Gimme' the context: context-driven automatic semantic annotation with C-PANKOW
Without the proliferation of formal semantic annotations, the Semantic Web is certainly doomed to failure. In earlier work we presented a new paradigm to avoid this: the 'Sel...
Günter Ladwig, Philipp Cimiano, Steffen Staab
PPOPP
2010
ACM
14 years 5 months ago
GAMBIT: effective unit testing for concurrency libraries
As concurrent programming becomes prevalent, software providers are investing in concurrency libraries to improve programmer productivity. Concurrency libraries improve productivi...
Katherine E. Coons, Sebastian Burckhardt, Madanlal...
HIPEAC
2010
Springer
14 years 5 months ago
Maestro: Orchestrating Lifetime Reliability in Chip Multiprocessors
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...
ICCAD
2006
IEEE
122views Hardware» more  ICCAD 2006»
14 years 4 months ago
Fill for shallow trench isolation CMP
Shallow trench isolation (STI) is the mainstream CMOS isolation technology. It uses chemical mechanical planarization (CMP) to remove excess of deposited oxide and attain a planar...
Andrew B. Kahng, Puneet Sharma, Alexander Zelikovs...
ICDCSW
2009
IEEE
14 years 2 months ago
Embedded Virtual Machines for Robust Wireless Control Systems
Embedded wireless networks have largely focused on openloop sensing and monitoring. To address actuation in closedloop wireless control systems there is a strong need to re-think ...
Rahul Mangharam, Miroslav Pajic