Sciweavers

143 search results - page 1 / 29
» Fast Line-Based Imaging of Small Sample Features
Sort
View
ICASSP
2007
IEEE
14 years 5 months ago
Fast Line-Based Imaging of Small Sample Features
This project aims to reduce the time required to attain more detailed scans of small interesting regions present in a quick first-pass sample image. In particular, we concentrate...
Mark A. Iwen, Gurjit S. Mandair, Michael D. Morris...
JMLR
2012
12 years 1 months ago
Domain Adaptation: A Small Sample Statistical Approach
We study the prevalent problem when a test distribution differs from the training distribution. We consider a setting where our training set consists of a small number of sample d...
Ruslan Salakhutdinov, Sham M. Kakade, Dean P. Fost...
CVPR
2008
IEEE
15 years 26 days ago
Boosting ordinal features for accurate and fast iris recognition
In this paper, we present a novel iris recognition method based on learned ordinal features.Firstly, taking full advantages of the properties of iris textures, a new iris represen...
Zhaofeng He, Zhenan Sun, Tieniu Tan, Xianchao Qiu,...
CVPR
2010
IEEE
13 years 11 months ago
Region moments: Fast invariant descriptors for detecting small image structures
This paper presents region moments, a class of appearance descriptors based on image moments applied to a pool of image features. A careful design of the moments and the image fea...
Gianfranco Doretto, Yi Yao