The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
When failures occur in Internet overlay connections today, it is difficult for users to determine the root cause of failure. An overlay connection may require TCP connections bet...
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
We consider the problem of finding a commonly agreed upon diagnosis for errors observed in a system monitored by a number of different expert agents. Each agent is assumed to hav...