259 search results - page 41 / 52 » Fault Tolerance for Manufacturing Components |
FPGA
2009
ACM
14 years 2 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...
DSN
2007
IEEE
14 years 1 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper investigates randomization and replication as strategies to achieve reliable performance in disk arrays targeted for video-on-demand (VoD) workloads. A disk array can p...
ICPPW
2009
IEEE
13 years 5 months ago
2009
IEEE
Current petascale systems have tens of thousands of hardware components and complex system software stacks, which increase the probability of faults occurring during the lifetime ...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...