Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...
This paper introduces the Perplexus hardware platform, a scalable computing substrate made of custom reconfigurable devices endowed with bio-inspired capabilities. This platform w...
Andres Upegui, Yann Thoma, Eduardo Sanchez, Andr&e...
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
This paper examines some models of FSMs that can be implemented in dynamically and statically reconfigurable FPGAs. They enable circuits for the FSMs to be constructed in such a wa...