258 search results - page 35 / 52 » Faults' context matters |
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
Dual core architectures are commonly used to establish fault tolerance on the node level. Since comparison is usually performed for the outputs only, no precise diagnostic informa...
DSN
2006
IEEE
14 years 1 months ago
2006
IEEE
Recent research has shown that even modern hard disks have complex failure modes that do not conform to “failstop” operation. Disks exhibit partial failures like block access ...
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
Test suite reduction uses test requirement coverage to determine if the reduced test suite maintains the original suite’s requirement coverage. Based on observations from our pr...
ISCA
2002
IEEE
14 years 14 days ago
2002
IEEE
Exponential growth in the number of on-chip transistors, coupled with reductions in voltage levels, makes each generation of microprocessors increasingly vulnerable to transient f...
DSN
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper describes an experiment in formal specification and validation performed in the context of an industrial joint project. The project involved an Italian company working...