376 search results - page 13 / 76 » Feedback-Directed Random Test Generation |
COMPSEC
2004
13 years 7 months ago
2004
Abstract Up to now biometric methods have been used in cryptography for authentication purposes. In this paper we propose to use biological data for generating sequences of random ...
IFIP
2001
Springer
14 years 7 days ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
VTS
2002
IEEE
14 years 21 days ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
IWANN
2009
Springer
14 years 2 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Intuition is often not a good guide to know which testing strategies will work best. There is no substitute for experimental analysis based on objective criteria: how many bugs a ...