376 search results - page 27 / 76 » Feedback-Directed Random Test Generation |
ISCAS
2003
IEEE
14 years 1 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
ACL
2009
13 years 5 months ago
2009
It is usually assumed that the kind of noise existing in annotated data is random classification noise. Yet there is evidence that differences between annotators are not always ra...
ITC
1996
IEEE
13 years 12 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
ISSTA
2010
ACM
13 years 9 months ago
2010
ACM
Testing object-oriented (OO) software is critical because OO languages are commonly used in developing modern software systems. In testing OO software, one important and yet chall...
ATS
2000
IEEE
14 years 7 days ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...