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AMC
2010
73views more  AMC 2010»
13 years 8 months ago
Re-seeding invalidates tests of random number generators
Hans Ekkehard Plesser, Anders Grønvik Jahns...
ITC
1996
IEEE
98views Hardware» more  ITC 1996»
13 years 12 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...
VLSID
1993
IEEE
136views VLSI» more  VLSID 1993»
13 years 12 months ago
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
M. Srinivas, Lalit M. Patnaik