In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
The 1990s are seeing the explosive growth of the Internet and Web-based information sharing and dissemination systems. The Internet is also showing a potential of forming of a sup...
We initiate a direction for proving lower bounds on the size of non-commutative arithmetic circuits. This direction is based on a connection between lower bounds on the size of no...