613 search results - page 123 / 123 » Finding and Fixing Faults |
CONSTRAINTS
2007
13 years 8 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
CONCURRENCY
2000
13 years 8 months ago
2000
The 1990s are seeing the explosive growth of the Internet and Web-based information sharing and dissemination systems. The Internet is also showing a potential of forming of a sup...
STOC
2010
ACM
14 years 6 months ago
2010
ACM
We initiate a direction for proving lower bounds on the size of non-commutative arithmetic circuits. This direction is based on a connection between lower bounds on the size of no...