19367 search results - page 142 / 3874 » Fine-Grain Process Modelling |
198
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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
114
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ICST
2009
IEEE
15 years 9 months ago
2009
IEEE
Automated static analysis can identify potential source code anomalies early in the software process that could lead to field failures. However, only a small portion of static ana...
108
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IJCAI
2003
15 years 3 months ago
2003
Multi-level spatial aggregates are important for data mining in a variety of scientific and engineering applications, from analysis of weather data (aggregating temperature and p...
44
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CORR
2010
Springer
15 years 2 months ago
2010
Springer
This paper investigates the effect of process variations on unity gain frequency (ft) in 30 nm gate length FinFET by performing extensive TCAD simulations. Six different geometric...
109
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BPM
2007
Springer
15 years 6 months ago
2007
Springer
Events are becoming more and more important for companies as an instrument of marketing communication. Event management is an interdisciplinary task field, addressed in the most di...