78 search results - page 6 / 16 » Flexible Modeling of Manufacturing Systems with Variable Lev... |
CODES
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
MICCAI
2003
Springer
14 years 8 months ago
2003
Springer
Abstract. This paper proposes a statistical model of functional landmarks delimiting low level visual areas which are highly variable across individuals. Low level visual areas are...
FTEDA
2006
13 years 7 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
ACSD
2004
IEEE
13 years 11 months ago
2004
IEEE
The design productivity gap has been recognized by the semiconductor industry as one of the major threats to the continued growth of system-on-chips and embedded systems. Ad-hoc s...
CODES
2009
IEEE
14 years 2 months ago
2009
IEEE
In this paper, we investigate the use of instruction set simulators (ISS) based on binary translation to accelerate full timed multiprocessor system simulation at transaction leve...