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CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
IJON
2006
13 years 7 months ago
2006
In this paper, we first design a more generalized network model, Improved CBP, based on the same structure as Circular BackPropagation (CBP) proposed by Ridella et al. The novelty ...
JCM
2008
13 years 7 months ago
2008
With the feature size of semiconductor technology reducing and intellectual properties (IP) cores increasing, on chip communication architectures have a great influence on the perf...
CPHYSICS
2007
13 years 7 months ago
2007
In parallel to the ITER project itself, many initiatives address complementary technological issues relevant to a fusion reactor, as well as many remaining scientific issues. One...
CSDA
2007
13 years 7 months ago
2007
The problem of choosing a good parameter setting for a better generalization performance in a learning task is the so-called model selection. A nested uniform design (UD) methodol...