202 search results - page 30 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
ISSRE
2000
IEEE
14 years 25 days ago
2000
IEEE
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
SSS
2010
Springer
13 years 6 months ago
2010
Springer
Design and implementation of distributed algorithms often involve many subtleties due to their complex structure, non-determinism, and low atomicity as well as occurrence of unanti...
DILS
2004
Springer
14 years 5 days ago
2004
Springer
Abstract. Ecologists spend considerable effort integrating heterogeneous data for statistical analyses and simulations, for example, to run and test predictive models. Our research...
RV
2010
Springer
13 years 6 months ago
2010
Springer
Researchers have developed a number of runtime verification tools that generate runtime monitors in the form of AspectJ aspects. In this work, we present Clara, a novel framework ...