2242 search results - page 22 / 449 » From testing to anti-product development |
DPHOTO
2009
13 years 5 months ago
2009
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
PGLDB
2003
13 years 9 months ago
2003
This paper reports the efforts which have been made towards a methodology based on elearning objects for the development of PGL modules. The Partnership in Global Learning (PGL) P...
TOOLS
1992
IEEE
13 years 11 months ago
1992
IEEE
This paper describes an Ei el system for rapid testing of grammars. Grammars are de ned in an extended BNF notation that allows actions on the parse tree nodes to be de ned as add...
MVA
2000
13 years 9 months ago
2000
The present paper proposes a new concept of image processing method based on vector representation for visual inspection test. The method was applied to detect defects and extract...
ASWEC
2009
IEEE
13 years 5 months ago
2009
IEEE
Failure of a design to satisfy a system's requirements can result in schedule and cost overruns. When using current approaches, ensuring requirements are satisfied is often d...