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GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
14 years 2 months ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra
OSDI
2008
ACM
14 years 9 months ago
KLEE: Unassisted and Automatic Generation of High-Coverage Tests for Complex Systems Programs
We present a new symbolic execution tool, KLEE, capable of automatically generating tests that achieve high coverage on a diverse set of complex and environmentally-intensive prog...
Cristian Cadar, Daniel Dunbar, Dawson R. Engler
ITSSA
2006
116views more  ITSSA 2006»
13 years 8 months ago
A Genetic Programming Approach to Automated Test Generation for Object-Oriented Software
: This article proposes a new method for creating test software for object-oriented systems using a genetic programming approach. It is believed that this approach is advantageous ...
Arjan Seesing, Hans-Gerhard Groß
TAP
2008
Springer
93views Hardware» more  TAP 2008»
13 years 8 months ago
Pex-White Box Test Generation for .NET
Pex automatically produces a small test suite with high code coverage for a .NET program. To this end, Pex performs a systematic program analysis (using dynamic symbolic execution,...
Nikolai Tillmann, Jonathan de Halleux
DFT
2006
IEEE
105views VLSI» more  DFT 2006»
14 years 2 months ago
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...