142 search results - page 27 / 29 » Functional test generation for non-scan sequential circuits |
IPSN
2005
Springer
14 years 2 months ago
2005
Springer
—We describe the development of a set of embedded system building blocks, known as eBlocks. An eBlock network can be viewed as a basic form of sensor network that can be develope...
IEEEARES
2006
IEEE
14 years 2 months ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
CVPR
2009
IEEE
15 years 4 months ago
2009
IEEE
Belief propagation (BP) is an effective algorithm for solving energy minimization problems in computer vision. However, it requires enormous memory, bandwidth, and computation beca...
PAMI
2010
13 years 7 months ago
2010
—In this paper, we present novel techniques that improve the computational and memory efficiency of algorithms for solving multi-label energy functions arising from discrete MRF...
ITC
1996
IEEE
14 years 21 days ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...