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» Gate Level Fault Diagnosis in Scan-Based BIST
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GLVLSI
2008
IEEE
150views VLSI» more  GLVLSI 2008»
13 years 7 months ago
Using unsatisfiable cores to debug multiple design errors
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...
André Sülflow, Görschwin Fey, Rod...