We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
Is there one logical de nition of diagnosis? In this paper I argue that the answer to this question is \no". This paper is about the pragmatics of using logic for diagnosis w...
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...