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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
BMCBI
2010
13 years 7 months ago
2010
Background: Large-scale genomic studies often identify large gene lists, for example, the genes sharing the same expression patterns. The interpretation of these gene lists is gen...
SGP
2003
13 years 9 months ago
2003
We propose a scheme for modeling point sample geometry with statistical analysis. In our scheme we depart from the current schemes that deterministically represent the attributes ...
MICCAI
2009
Springer
14 years 8 months ago
2009
Springer
Statistical shape models have gained widespread use in medical image analysis. In order for such models to be statistically meaningful, a large number of data sets have to be inclu...
BMCBI
2010
13 years 7 months ago
2010
Background: Data generated using `omics' technologies are characterized by high dimensionality, where the number of features measured per subject vastly exceeds the number of...