68 search results - page 12 / 14 » Generation of compact test sets with high defect coverage |
VLSID
1998
IEEE
13 years 11 months ago
1998
IEEE
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
DFT
2002
IEEE
14 years 13 days ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
ISSRE
2003
IEEE
14 years 23 days ago
2003
IEEE
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
ENTCS
2010
13 years 7 months ago
2010
Component based development allows to build software upon existing components and promises to improve software reuse and reduce costs. To gain reliability of a component based sys...
CVPR
2005
IEEE
14 years 9 months ago
2005
IEEE
Human hair is a very complex visual pattern whose representation is rarely studied in the vision literature despite its important role in human recognition. In this paper, we prop...