1448 search results - page 5 / 290 » Genetic Algorithms for Dynamic Test Data Generation |
GEM
2008
13 years 9 months ago
2008
Abstract--We present an approach to compress arbitrary files using a Huffman-like prefix-free code generated through the use of a genetic algorithm, thus requiring no prior knowled...
GECCO
2003
Springer
14 years 25 days ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
The problem of testing from an extended finite state machine (EFSM) can be expressed in terms of finding suitable paths through the EFSM and then deriving test data to follow the ...
VLSID
1997
IEEE
13 years 11 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
VLSID
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...