1448 search results - page 7 / 290 » Genetic Algorithms for Dynamic Test Data Generation |
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
SIGSOFT
2003
ACM
14 years 8 months ago
2003
ACM
This paper presents a novel approach for automated test data generation of imperative programs containing integer, boolean and/or float variables. It extends our previous work to ...
COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
13 years 7 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...
HPDC
2005
IEEE
14 years 1 months ago
2005
IEEE
good data partitioning scheme is the need of the time. However it is very diflcult to arrive at a good solution as the number of possible dutupartitionsfor a given real lifeprogra...
CORR
2010
Springer
13 years 6 months ago
2010
Springer
Genetic algorithms are a population-based Meta heuristics. They have been successfully applied to many optimization problems. However, premature convergence is an inherent charact...