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IWVF
2001
Springer
15 years 6 months ago
Integration of Local and Global Shape Analysis for Logo Classification
Jan Neumann, Hanan Samet, Aya Soffer
74
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DCC
1997
IEEE
15 years 6 months ago
Capturing Global Redundancy to Improve Compression of Large Images
Barbara L. Kess, Stephen E. Reichenbach