809 search results - page 47 / 162 » Handling variations and uncertainties |
IROS
2006
IEEE
14 years 2 months ago
2006
IEEE
In this investigation a robotic system’s dynamic performance is optimized for high reliability under uncertainty. The dynamic capability equations allow designers to predict the...
ASPDAC
2009
ACM
14 years 3 months ago
2009
ACM
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. In the presence of process variations, wo...
DAC
2004
ACM
14 years 9 months ago
2004
ACM
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
ICCAD
2004
IEEE
14 years 5 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
ICIP
2007
IEEE
14 years 10 months ago
2007
IEEE
Automatically discovering common visual patterns in images is very challenging due to the uncertainties in the visual appearances of such spatial patterns and the enormous computa...