160 search results - page 3 / 32 » Highly Scalable Rough Set Reducts Generation |
KAIS
2000
13 years 9 months ago
2000
When data sets are analyzed, statistical pattern recognition is often used to find the information hidden in the data. Another approach to information discovery is data mining. Dat...
ESWA
2007
13 years 9 months ago
2007
Packaging is classified as one of back-end processes in the integrated circuits (ICs) manufacturing, highly capital-intensive and involves complex processes. Unlike the front-end...
PR
2007
13 years 9 months ago
2007
Ensemble learning is attracting much attention from pattern recognition and machine learning domains for good generalization. Both theoretical and experimental researches show tha...
KDD
2001
ACM
14 years 10 months ago
2001
ACM
The similarity join is an important operation for mining high-dimensional feature spaces. Given two data sets, the similarity join computes all tuples (x, y) that are within a dis...
ET
1998
13 years 9 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...