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ATVA
2006
Springer
102views Hardware» more  ATVA 2006»
13 years 11 months ago
A Semantic Framework for Test Coverage
Abstract. Since testing is inherently incomplete, test selection is of vital importance. Coverage measures evaluate the quality of a test suite and help the tester select test case...
Laura Brandán Briones, Ed Brinksma, Mari&eu...
VLSISP
2008
173views more  VLSISP 2008»
13 years 7 months ago
Fast Bit Gather, Bit Scatter and Bit Permutation Instructions for Commodity Microprocessors
Advanced bit manipulation operations are not efficiently supported by commodity word-oriented microprocessors. Programming tricks are typically devised to shorten the long sequence...
Yedidya Hilewitz, Ruby B. Lee
MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
14 years 19 days ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
SPE
1998
129views more  SPE 1998»
13 years 7 months ago
Timing Trials, or the Trials of Timing: Experiments with Scripting and User-Interface Languages
This paper describes some basic experiments to see how fast various popular scripting and user-interface languages run on a spectrum of representative tasks. We found enormous var...
Brian W. Kernighan, Christopher J. Van Wyk
CSMR
2010
IEEE
13 years 2 months ago
Does the Past Say It All? Using History to Predict Change Sets in a CMDB
To avoid unnecessary maintenance costs in large IT systems resulting from poorly planned changes, it is essential to manage and control changes to the system and to verify that all...
Sarah Nadi, Richard C. Holt, Serge Mankovski