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DAC
2008
ACM
14 years 8 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2008
ACM
14 years 8 months ago
Daedalus: toward composable multimedia MP-SoC design
Daedalus is a system-level design flow for the design of multiprocessor system-on-chip (MP-SoC) based embedded multimedia systems. It offers a fully integrated tool-flow in which ...
Hristo Nikolov, Mark Thompson, Todor Stefanov, And...
ICSE
2008
IEEE-ACM
14 years 8 months ago
Impact analysis of database schema changes
We propose static program analysis techniques for identifying the impact of relational database schema changes upon object-oriented applications. We use dataflow analysis to extra...
Andy Maule, Wolfgang Emmerich, David S. Rosenblum
SIGSOFT
2008
ACM
14 years 8 months ago
Profile-guided program simplification for effective testing and analysis
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
Lingxiao Jiang, Zhendong Su
ISBI
2008
IEEE
14 years 8 months ago
Integrated profiling of cell surface protein and nuclear marker for discriminant analysis
Cell membrane proteins play an important role in tissue architecture and cell-cell communication. We hypothesize that segmentation and multivariate characterization of the distrib...
Ju Han, Hang Chang, Kumari L. Andarawewa, Paul Yas...