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IPCV
2007
13 years 9 months ago
Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights
- The shrunk dimension of electronic devices leads to more stringent requirement on process control and quality assurance of their fabrication. For instance, direct die-to-die bond...
Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. ...
ICMCS
2006
IEEE
135views Multimedia» more  ICMCS 2006»
14 years 1 months ago
Inquiring of the Sights from the Web via Camera Mobiles
In this paper, we presented an image search service for mobile users. It can be used to acquire related information by taking and sending pictures to the server, for example, gett...
Yinghua Zhou, Xin Fan, Xing Xie, Yuchang Gong, Wei...
IJON
2006
91views more  IJON 2006»
13 years 7 months ago
Symmetry axis extraction by a neural network
This paper proposes a neural network model that extracts axes of symmetry from visual patterns. The input patterns can be line drawings, plane figures or gray-scaled natural image...
Kunihiko Fukushima, Masayuki Kikuchi
KDD
2009
ACM
249views Data Mining» more  KDD 2009»
14 years 8 months ago
Drosophila gene expression pattern annotation using sparse features and term-term interactions
The Drosophila gene expression pattern images document the spatial and temporal dynamics of gene expression and they are valuable tools for explicating the gene functions, interac...
Shuiwang Ji, Lei Yuan, Ying-Xin Li, Zhi-Hua Zhou, ...
ECCV
2010
Springer
13 years 10 months ago
Image Segmentation with Topic Random Field
Abstract. Recently, there has been increasing interests in applying aspect models (e.g., PLSA and LDA) in image segmentation. However, these models ignore spatial relationships amo...