6160 search results - page 1088 / 1232 » Image and Feature Co-Clustering |
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
DAGSTUHL
2007
13 years 9 months ago
2007
Abstract. We propose a new matrix learning scheme to extend Generalized Relevance Learning Vector Quantization (GRLVQ). By introducing a full matrix of relevance factors in the dis...
DICTA
2007
13 years 9 months ago
2007
Current research on shape based classification has been generally aimed at utilising various visual features. Previous research has shown that the existing knowledge in a specific...
TRECVID
2008
13 years 9 months ago
2008
In this paper we describe our experiments in all task of TRECVid 2008. This year, we have concentrated mainly on the local (affine covariant) image features and its transformation...
DGO
2004
13 years 9 months ago
2004
We present a web-based environment for the Automated Dental Identification System (ADIS). This system is designed for identification missing, unidentified and wanted persons based...