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EVOW
2008
Springer
15 years 6 months ago
Evolving an Automatic Defect Classification Tool
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Assaf Glazer, Moshe Sipper
UAI
2008
15 years 5 months ago
Projected Subgradient Methods for Learning Sparse Gaussians
Gaussian Markov random fields (GMRFs) are useful in a broad range of applications. In this paper we tackle the problem of learning a sparse GMRF in a high-dimensional space. Our a...
John Duchi, Stephen Gould, Daphne Koller
AAAI
2004
15 years 5 months ago
Automatic Generation of Artistic Chinese Calligraphy
We introduce a novel intelligent system which can generate new Chinese calligraphic artwork that meets certain aesthetic requirements automatically. In the machine learning phase,...
Songhua Xu, Francis C. M. Lau, Kwok-Wai Cheung, Yu...
GRAPHICSINTERFACE
2004
15 years 5 months ago
Object Representation using 1D Displacement Mapping
In this paper, we propose a new method for rendering image-based objects. An object is decomposed into a set of 1D displacement textures in a preprocessing stage. During rendering...
Yi Xu, Yee-Hong Yang
ICVGIP
2004
15 years 5 months ago
Probabilistic Measures for Motion Segmentation
The first contribution of this paper is a probabilistic approach for measuring motion similarity for point sequences. While most motion segmentation algorithms are based on a rank...
Venu Madhav Govindu