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» Improved Low-Degree Testing and its Applications
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CCS
2010
ACM
13 years 8 months ago
Sidebuster: automated detection and quantification of side-channel leaks in web application development
A web application is a "two-part" program, with its components deployed both in the browser and in the web server. The communication between these two components inevita...
Kehuan Zhang, Zhou Li, Rui Wang 0010, XiaoFeng Wan...
VR
2007
IEEE
14 years 2 months ago
Designing and Evaluating a Haptic System for Biomolecular Education
In this paper we present an in situ evaluation of a haptic system, with a representative test population, we aim to determine what, if any, benefit haptics can have in a biomolec...
Petter Bivall Persson, Matthew D. Cooper, Lena A. ...
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 9 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
CVPR
2012
IEEE
11 years 11 months ago
Icon scanning: Towards next generation QR codes
Undoubtedly, a key feature in the popularity of smartmobile devices is the numerous applications one can install. Frequently, we learn about an application we desire by seeing it ...
Itamar Friedman, Lihi Zelnik-Manor
VTS
2003
IEEE
95views Hardware» more  VTS 2003»
14 years 1 months ago
Built-In Reseeding for Serial Bist
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
Ahmad A. Al-Yamani, Edward J. McCluskey