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» Improved Low-Degree Testing and its Applications
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ITC
2003
IEEE
176views Hardware» more  ITC 2003»
14 years 1 months ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...
ATS
2000
IEEE
98views Hardware» more  ATS 2000»
14 years 1 months ago
Embedded core testing using genetic algorithms
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
Ruofan Xu, Michael S. Hsiao
WSE
2002
IEEE
14 years 1 months ago
Dynamic Model Extraction and Statistical Analysis of Web Applications
The World Wide Web, initially intended as a way to publish static hypertexts on the Internet, is moving toward complex applications. Static Web sites are being gradually replaced ...
Paolo Tonella, Filippo Ricca
IWUC
2004
13 years 10 months ago
Ubiquitous Application Development using a Mobile Agent-based System
Abstract. This study proposes a methodology that allows the flexible and maintainable development of application based on mobile agent to a ubiquitous environment. Ubiquitous envir...
Kazutaka Matsuzaki, Nobukazu Yoshioka, Shinichi Ho...
PAISI
2007
Springer
14 years 2 months ago
Security Assessment for Application Network Services Using Fault Injection
Vulnerabilities in network protocol software have been problematic since Internet infrastructure was deployed. These vulnerabilities damage the reliability of network software and ...
Hyungwoo Kang, Dong Hoon Lee