We exhibit an explicitly computable ‘pseudorandom’ generator stretching l bits into m(l) = lΩ(log l) bits that look random to constant-depth circuits of size m(l) with log m...
Impagliazzo and Wigderson IW97] have recently shown that if there exists a decision problem solvable in time 2O(n) and having circuit complexity 2 (n) (for all but nitely many n) ...
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...